Infrared method and apparatus for measuring gas concentration including electronic calibration

ABSTRACT

An automatic calibration technique for a gas analyzer includes applying electrical energy to a source that is different from the level used to detect gas concentration in order to produce a different level of radiation from that used to detect gas concentration. The different level is applied with a non-absorbing gas in the gas sample chamber. The detector output at the reduced level is resolved to a calibration factor. The instrument can be linearized by repeating the calibration procedure at multiple different levels of reduced source radiation. In one embodiment, source assembly (26) is provided that includes a plurality of infrared emitters (36) to which is applied modulated electrical energy in a timed sequence in order to produce output levels for three component gas concentrations. A filter (56) between each one of the sources (36) and a detector (50) pass radiation at an absorption line of one of the component gases.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation-in-part of application Ser. No.07/979,818, filed Nov. 20, 1992, now abandoned.

BACKGROUND OF THE INVENTION

This invention relates generally to gas analyzers for detecting one ormore component gas concentrations in a sample and, more particularly, tonon-dispersive infrared gas analyzers.

Non-dispersive infrared gas analyzers have long been known. Suchanalyzers direct a source of infrared radiation along an optical path ina preselected spectral band having at least one absorption line of thecomponent gas to be detected. A detector, positioned in the opticalpath, detects radiation in the preselected spectral band and produces adetector output. A sample chamber is positioned in the optical pathbetween the source and the detector in order to contain a quantity ofthe sample gas, which includes the component gas to be detected. Suchinfrared gas analyzers have suffered from numerous problems. Theirresponse time, being on the order of one to three seconds, is much tooslow for many applications. For example, it is not practical toaccurately track a patient's respiration carbon dioxide level with aninstrument having a response time of between one and three seconds.Furthermore, known systems have been plagued with temperature and agedrift problems, which has resulted in costly and complicatedcompensation schemes. Such compensation schemes further limit theadaptability of the instrument because they increase the size and reducethe reliability of the instrument.

Sources for infrared gas analyzers radiate electromagnetic energy in theinfrared band by applying a current to a resistance element, such as atungsten alloy filament. In order to increase the emissivity of thesource, it is known to run the source at ever-increasing temperatures.One difficulty with such an approach is that it increases the oxidationof the source element. Such oxidation not only reduces the efficiency ofthe source, but results in a significant amount of drift in the sourceemissivity over time. This instability must be compensated for in orderto avoid a resulting inaccuracy in analyzer readings. One approach atsolving this problem has been to coat the element with a ceramic jacketin order to avoid oxidation of the elements. Although this approach mayreduce oxidation of the element per se, various oxides are still formedand deposited on the ceramic layer resulting in undesirable variation inthe source emissivity.

In order to overcome the degrading effects of source oxidation onanalyzer accuracy, the prior an has attempted to sense the level ofsource emissivity by placing, for example, temperature sensors in aposition to monitor the temperature of the source. Because sourceemissivity is proportional to temperature, the output of the temperaturesensor may be used in a feedback loop to regulate the current applied tothe source and, in theory, maintain a constant level of emissivity ofthe source. The principle behind this approach is that, if sourceemissivity is regulated to a constant level, system drift will then bekept to a minimum. In practice, this has not worked satisfactorily. Theextensive amount of heat generated by the source introduces second andthird order errors in the detector circuitry, as well as in the system'soptics. These errors have proven to be significant in degrading systemperformance. An alternative approach has been to apply the output of thesource temperature sensor to regulate the detector circuitry. This hasproven to be equally futile for the same reasons. The heating of thesystem components by the source has introduced errors that may not bereadily compensated for.

Another approach at applying compensation to a gas analyzer system hasbeen to divide the radiation path either spatially into two beams, areference beam and a sensing beam, or, temporally, into a sequence ofintermittent transmissions between the source and detector separated byblank periods when no beam is being transmitted. The principle behindthis approach is that the detection circuitry may provide an accuratereading by comparing the reference beam, or period, with the sensedbeam, or period, in order to subtract the effect of source strength fromthe detected signals. One approach at temporally dividing the detectedsignal into intermittent pulses is by chopping the light sourceutilizing a mechanical vibrating device or rotating device. Thisapproach has several difficulties. The requirement for a mechanicaldevice not only adds to the bulk and complexity of the system, but alsoadds to the system's low reliability. Furthermore, the thermopiledetectors that are commonly used in infrared gas analyzers respond veryslowly to the large swing in the detected beam between the blank periodsand the sensing periods. This contributes to a system response time onthe order of one to three seconds for such systems.

Another approach to temporally dividing the beam into intermittentsegments is by switching the source periodically between off and onconditions. Because source emissivity is a function of heat output, theyare not readily switched between off and on conditions because the heatmust dissipate between each interval. As a result, switched source gasanalyzers have the same difficulty of slow system response time as dothe mechanically chopped beam systems. Furthermore, the periodicswitching of the source introduces temperature variations to the systemcomponents, which not only degrades the system's longevity but also makeappropriate compensation impractical.

In order to calibrate an infrared gas analyzer, both zero, or offset,and span calibration procedures are performed. The zero calibration isin order to compensate for any offset in the amplifiers and istraditionally performed by filling the sample chamber with a gas, suchas air or nitrogen, that does not absorb infrared radiation at theabsorption line of the gas detected by the analyzer. With thenon-absorbing gas filling the chamber, the offset of the output ismeasured and, either stored for compensation in the gas concentrationreading, or is reduced to a zero value. The span calibration istraditionally performed by filling the sample chamber with a knownconcentration of the gas or gases to be detected. The output is adjustedto correspond with the known gas concentration. Such span calibration istime-consuming and utilizes expensive calibration gases which are oftentoxic. As a result, alternate span calibration techniques have beenproposed but all suffer from some deficiencies. One known alternativetechnique is to partially occlude the source with a partial transmissionfilter, or the like, in order to simulate the introduction of a knownconcentration of the gas to be measured. However, the introduction ofthe occluding member requires a mechanical movement.

Another alternative proposal is to inject an electrical current into theoutput amplifier of the electronic control in order to simulate theeffect of a calibration gas in the sample chamber. While such techniquedoes not suffer the drawbacks described with respect to the other knownspan calibration techniques, it is only capable of calibrating theoutput amplifier. It is incapable of compensating for fouling of thesurfaces of the sample chamber or degradation in source performance.

In addition to the zero and the span calibrations, both of which can beperformed in the field, an additional procedure must be occasionallyperformed at the factory or a service center. This additional procedureis a relinearization of the instrument. This results from thedegradation of the source and the fouling of the sample chamber, inaddition to drift and the like in the electronics, due to componentaging. Because the relationship between the detector output and thesource input varies according to a non-linear relationship, anyvariations in the performance of the component require that theinstrument be calibrated at multiple values of sample gas calibration.The necessity to periodically return the instrument to the factory or aservice center results in a significant increase in the total operatingexpense of an infrared gas analyzer.

SUMMARY OF THE INVENTION

The present invention is intended to provide a gas analyzer having aresponse time never before achieved in the art. This is accomplished ina manner that reduces power requirements to a level which allowsoperation of the gas analyzer from portable power sources, such asminiature batteries. This combination of features allows applicationsnever before achieved with conventional gas analyzer technology. Forexample, response times sufficiently fast to allow real time monitoringof the carbon dioxide level of a patient's respiration are now possible.With increased reliability and superior drift performancecharacteristics, gas analyzer technology may be incorporated intoportable diagnostic instruments as an ancillary feature to standarddiagnostic tools.

The invention is embodied in an infrared gas analyzer and method fordetecting a component gas in a gas sample. Infrared radiation isproduced by an infrared radiation source, having at least one absorptionline of a component gas to be detected, and directed along an opticalpath through a gas sample. A detector positioned in the optical pathdetects the infrared radiation attenuated by absorption of the componentgas. A control resolves the detected infrared radiation to component gasconcentration. The control does this in a manner that is independent ofa reference level of the radiation. By avoiding the necessity fordeveloping a reference level, the invention provides an exceptionallyfast and compact apparatus with no moving parts. Response times of 250milliseconds or less are possible according to the invention.

This may be accomplished, according to another aspect of the invention,by providing a source which includes an infrared emitter enclosed in aspace defined within a gas-impervious envelope with the space being voidof reactive gases. The envelope is made of a material that transmitsinfrared radiation. In a preferred embodiment, the space is evacuated.The material making up the envelope is quartz. In a most preferredembodiment, the source is a visible light source that is operated atapproximately 50% of rated voltage. Such source is exceptionally stableand does not significantly heat the sample chamber and thereby avoidsinstability requiring a reference level. In addition, the source isoptically coupled with the sample chamber in a manner that does notreflect heat back toward the source which causes heating in prior artunits. In an illustrated embodiment, the source is in direct contactwith the sample gas.

The invention provides an exceptionally compact, low power, gas analyzerwhich has no moving parts. The illustrated embodiment is of a gasanalyzer which is capable of operation with less than one watt of power.The internal volume of the sample chamber is approximately 0.5 mm³ inorder to detect carbon dioxide at 0-20% concentrations. The entire gasanalyzer occupies a volume of less than two cubic inches. The inventionmay be adapted to detecting multiple component gases in a sample in amanner which is set forth in detail in the following specification.

According to another aspect of the invention, a calibration techniquefor a gas analyzer is provided. The technique includes applyingelectrical energy to the source at a level that is different from thelevel used to detect gas concentration in order to produce a differentlevel of radiation from that used to detect gas concentration. Thisdifferent level of radiation is directed through an optical path otherthan through the gas sample in order to produce a detector output value.The detector output is resolved to a calibration factor. This aspect ofthe invention requires a source and detector that are characterized by alinear relationship between energy applied to the source and the outputsignal derived from the detector. In this manner, a known reduction inthe energy applied to the source results in a proportionate reduction inthe anticipated detector output. By comparing the anticipated detectoroutput for a given source energy level with the measured detectoroutput, a calibration factor may be stored in a look-up table andapplied to the actual detector output during sample gas measurementprocedures.

A calibration technique according to the invention additionallycomprehends an improved linearization of the instrument that isperformed by repeating the span calibration at multiple different levelsof source radiation. Not only does such procedure avoid the use ofexpensive and often toxic calibration gases, or mechanical components toimpose a shutter in the gas pathway, it also provides for completecalibration of the entire gas analyzer including the source, samplechamber walls, and the detector. Advantageously, this is accomplished bya software procedure which may be carried out with an on-boardmicroprocessor or other control circuitry. Advantageously, the procedurecan be performed in the field and, indeed, may be performed in theamount of time that is dedicated to the zeroing of prior artinstruments.

These and other objects, advantages and features of this invention willbecome apparent upon review of the following specification inconjunction with the drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective view of an infrared gas analyzer according tothe invention;

FIG. 2 is the same view as FIG. 1 of a sensing assembly;

FIG. 3 is an exploded perspective view of the sensing assembly in FIG.2;

FIG. 4 is a sectional, hew taken along the lines IV--IV in FIG. 2;

FIG. 5 is a section view taken along the lines V--V in FIG. 3;

FIG. 6 is an exploded perspective view of a source assembly according tothe invention;

FIG. 7 is an enlarged sectional view taken along the lines VII--VII inFIG. 6;

FIG. 8 is a sectional view taken along the lines VIII--VIII in FIG. 3;

FIG. 9 is an end elevation of a detector useful with the invention;

FIG. 10 is the same view as FIG. 9 of an alternative embodiment of adetector;

FIG. 11 is an electrical schematic diagram of a circuit useful with theinvention;

FIG. 12 is a graph comparing source input to voltage and detector outputvoltage;

FIG. 13 is a block diagram of an alternative embodiment of an infraredgas analyzer according to the invention;

FIG. 14 is a flowchart of a control program for the infrared gasanalyzer in FIG. 13; and

FIG. 15 is a block diagram of another alternative embodiment of theinvention.

DESCRIPTION OF THE PREFERRED EMBODIMENT

Referring now specifically to the drawings, and the illustrativeembodiments depicted therein, an infrared gas analyzer 15 includes asensor assembly 16 mounted to an electronic assembly 18 and encapsulatedwithin encapsulation material 20 (FIG. 1). A metallic jacket (not shown)encloses encapsulation material 20. In the illustrated embodiment,encapsulation material 20 is silicone rubber and is surrounded by acast-aluminum jacket.

Sensor assembly 16 includes a tubular sample chamber assembly 22 havingopen ends 24a and 24b thereof, a source assembly 26 fitted within oneopen end 24a and a detector assembly 28 fitted within the other open end24b (FIGS. 2-4). Sample chamber assembly 22 includes a cylindrical wall30 which, along with source assembly 26 and detector assembly 18,encloses a sample chamber 32. A pair of tubes 34a, 34b penetrate wall 30in order to provide ingress and egress of a sample gas into samplechamber 32. The sample gas may be supplied to sample chamber 32 underpositive pressure by a sample pump (not shown) or by diffusion. In theillustrated embodiment of a carbon dioxide (CO₂) gas analyzer forsensing between zero and 2055 carbon dioxide levels, sample chamber 32has a volume of 0.5 mm³. For detecting component gases at lowerconcentrations, it may be necessary to increase the volume of samplechamber 32 correspondingly. Sample chamber assembly 22 may be made froma metal, such as aluminum, or a composite material, such as a polymer.

Source assembly 26 includes a source 36 and a reflector 38. Reflector 38is made from aluminum and has a polished reflecting surface 40 that iseither elliptical or parabolic in shape. Source 36 includes an infraredemitting element 42, which is supplied with an electrical current fromelectronic assembly 18 through electrical leads 44a and 44b. Emittingelement 42 is positioned within chamber 46. Chamber 46 is surrounded byan envelope 48 made of a material that is a good transmitter ofelectromagnetic radiation in the infrared band of between 0.5micrometers and 5.0 micrometers. Chamber 46 is void of any active gaseswhich may react with the material of emitting element 42. In a preferredembodiment, chamber 46 is evacuated to form a vacuum. Envelope 48 mustalso be made from a material which is capable of being molded and whichis gas impervious in order to avoid any exchange of atmospheric gas withchamber 46. In the illustrated embodiment, envelope 48 is made fromquartz. Emitting element 42 is a filament of tungsten alloy. In theillustrated embodiment, source 36 is commercially available and ismarketed by Chicago Miniature under Model No. 7219. Chicago MiniatureModel No. 7219 is marketed as a miniature panel light and is, therefore,commercially provided for the purposes of generating visible light. Inthe illustrated embodiment, source 36 is energized from a power sourceat a voltage level that is 50% of the rated voltage advised by ChicagoMiniature Model No. 7219. Accordingly, in use, emitting element 42 givesoff very little visible light. It emits primarily in the infraredregion. Although, in the preferred embodiment, a commercially availableminiature lamp is used, not all incandescent lamps are suitable.Incandescent lamps are typically enclosed with glass envelopes. Glass isa poor conductor of infrared radiation and, typically, cuts offtransmission at wavelengths well below the infrared band.

Detector assembly 28 includes a 48-junction thermopile sensor 50enclosed within an argon-filled container 52. Container 52 is closed bya sapphire window 54, which allows infrared radiation to penetrate thecontainer. An optical filter 56 is positioned within container 52 in theradiation pathway between source 36 and sensor 50. Optical filter 56passes energy at the wavelength of the absorption line of the componentgas to be detected. In the illustrated embodiment, detector assembly 28is commercially available and is marketed by Dexter Research under ModelNo. 2M. A plurality of leads 57 supply the output from sensor 50 toelectronic assembly 18.

Detector assembly 28 is for the purpose of detecting a single componentgas in a sample. Gas analyzer 15 may be adapted to detecting a pluralityof component gases in a sample by utilizing a detector assembly 28' inwhich a plurality of sensors 50a, 50b and 50c are positioned within theradiation pathway. Each sensor 50a-50c is positioned behind an opticalfilter (not shown) having a transmission band at the absorption line ofthe component gas to be detected by the associated sensor 50a-50c. Indetector assembly 28', a fourth sensor 50d is not exposed to theradiation from source 36 but is provided for the purpose of monitoringthe temperature of the detector assembly for first-order temperaturecompensation of sensor outputs. If gas analyzer 15 is utilized tomonitor the carbon dioxide level of a patient's respiration, or thecarbon dioxide level within a biological test chamber, a single detectorassembly 28 is provided wherein optical filter 56 transmits radiation at4.25 micrometers. As previously set forth, concentration of carbondioxide from between zero and 20% may be measured by a sample chambervolume of 0.5 milliliters. If gas analyzer 15 is utilized to measureautomotive vehicle emission gases, a multiple sensor detector assembly28' is utilized wherein the sensors 50a-50c are positioned behindoptical filters which transmit at 3.5 micrometers for detectinghydrocarbons (hexane), 4.65 micrometers for detecting carbon monoxideand 4.25 micrometers for detecting carbon dioxide. Such a multiplesensor detector assembly 28' is commercially available and is marketedby Dexter Research under Model No. DR26 for dual sensor. A quad sensor,such as that illustrated in FIG. 10, is marketed by Armtec-Ragen underModel No. PS24.

In order to provide an accurate determination of the concentration ofthe component gas of interest in the sample, electronic assembly 18amplifies the signal produced by sensor 50 by a factor of approximately50,000 and provides first-order temperature compensation for ambienttemperature. This latter function is necessary because a thermopilesensor drifts at a rate of 0.4% per degree centigrade. Electronicassembly 18 includes an amplifier 58 whose gain is established by afeedback resistor 60, connected between an output 62 and an invertinginput 64, and by a resistor 65 connected between inverting input 64 andsignal ground (FIG. 11 ). Sensor 50 is connected between a non-invertinginput 66 of amplifier 58 and signal ground. The case 52 of detectorassembly 28 is also grounded. Output 62 of amplifier 58 is supplied tothe non-inverting input 68 of an amplifier 70. The gain of amplifier 70is established by feedback resistors 72, 74 and R_(g) and a resistor R₁connected in series with an inverting input 76. Resistor R₁ is, in turn,connected with an output 78 of an amplifier 80. Amplifier 80 has anon-inverting input 82 connected to signal ground with a bias resistor84. Amplifier 80 additionally includes an inverting input 86 connectedto an output 91 of a temperature sensor 88 through a bias resistor 90.Temperature sensor 88 has an input that is connected with a source ofvoltage at 89. Inverting input 86 is additionally connected, through abias resistor 96, with the wiper 95 of a potentiometer R_(z) connectedbetween a positive voltage source 92 and a negative voltage source 94.Amplifier 80 additionally includes a feedback resistor 98 connectedbetween output 78 and inverting input 86.

Output 100 of amplifier 70 is supplied to an inverting input 102 of anamplifier 104. A non-inverting input 106 of amplifier 104 is suppliedwith a reference voltage produced by a unity gain amplifier 108 that issupplied with a stable voltage from a zener diode 110 connected inseries with a bias resistor 112 to a voltage source 114. The referencevoltage level on input 106 is adjustable by an adjustable resistor 117.The output of amplifier 104 provides a voltage V_(out), which isproportional to the concentration of the detected component gas, at 120.

The value of V_(out) on output 120 is as follows:

    V.sub.out =(V.sub.ref -V.sub.det)  1+2R.sub.1 /R.sub.g !+V.sub.offset +V.sub.tempcomp

where

V_(ref) is the voltage at input 106;

V_(det) is the voltage at output 62;

R₁ is the resistance of resistor R₁ ;

R_(g) is the combined series resistance of resistors 72 and R_(g) ;

V_(offset) is the voltage at wiper 95; and

V_(tempcomp) is the voltage at output 91.

The span of amplifier chain in electronic assembly 18 is established bythe R₁ /R_(g) term and is adjustable by adjusting the value of variableresistor R_(g). The value of V_(offset), which establishes the offset ofthe amplifier chain, is established by adjusting the position of wiper95 of variable resistor R_(z). Thus, it is seen that the amplifier chainin electronic assembly 18 allows for independent adjustment of the zerooffset and the span. It is also seen that the temperature dependency ofsensor 50 is compensated for by temperature sensor 88 and associatedcircuitry. Temperature sensor 88 detects ambient temperature. Becauseall components of gas analyzer 15 are encapsulated by encapsulationmaterial 20, the temperature of sensor 50 is very stable and notsusceptible to abrupt changes in ambient temperature. Furthermore, anychanges in the temperature of sensor 50 are accurately detected bytemperature sensor 88. As set forth above, temperature sensor 88 may besensor 50d incorporated within detector assembly 28' behind a darkpanel. Although the zero offset and the span of electronic package 18are illustrated as being adjusted by adjustable resistors R_(z) andR_(g), such resistors could be replaced by interconnections with anautomatic control system which could supply suitable calibrationvoltages to the amplifier chain of the electronic assembly according toknown techniques, in order to avoid the necessity for manualcalibration. Thus, it is seen that electronic assembly 18 is adaptableto stand-alone operation or to interface with an automatic controlsystem.

In the illustrated embodiment, amplifier 58 is a chopper-stabilizedamplifier, which is exceptionally stable. Such amplifier is commerciallyavailable from a variety of suppliers under industry Model No.LTC1050CS8. Amplifiers 70, 80, 104 and 108 are provided in a singlepackage under Model No. LT1014DS. The positive and negative voltagesources may be supplied from a unipolar battery by the provision of acommercially available voltage converter (not shown). Emitting element42 of source 36 is supplied continuously with a regulated DC voltagethrough lead 44a from a regulated DC voltage source 125. The oppositelead 44b is connected with signal ground. The voltage at voltage source125 is six volts DC in the illustrated embodiment. Chicago Miniaturepanel light Model No. 7219 has a rated voltage of 12 volts DC.

Because emitting element 42 is positioned within a chamber that is voidof reacting gases, there is no potential for the formation of oxides ofthe material composing the emitting element or of any surroundingmaterial. Furthermore, because the emitting element is surrounded by avacuum, in the preferred embodiment, its color temperature is maintainedat a much lower wattage input because the emitting element is not beingcooled by surrounding atmosphere. Also, the vacuum surrounding theemitting element significantly reduces variations in its colortemperature due to ambient temperature variations. Additionally, becausethe emitting element is not heating the surrounding atmosphere, thedetrimental effects of heating of surrounding components, resulting insecond and third order errors, is virtually eliminated. Becauseoxidation of the emitting element does not occur, the radiation outputof the element is exceptionally stable over very long periods of time.Because the source is inherently stable, there is no need for monitoringthe temperature, or emissivity, of the source as an input to astabilizing feedback control circuit, or as a compensation input to thedetector amplifier circuitry, as required in prior infrared gasanalyzers.

Because the source is inherently stable, there is, further, no necessityfor interrupting the radiation beam between source 36 and sensor 50 toensure a drift-free output level. Accordingly, the detrimental effectsof prior art switched sources, in which system response time suffersfrom the relatively slow periodic cycling of the source, as well as theattendant reduction in system reliability from the thermal stress, areeliminated. The equally slow performance of the mechanically choppedsystems, with the attendant reduction in system reliability frommechanical failures, are also eliminated.

The invention is capable of implementation in a system havingexceptionally low noise levels and very stable, low drift, output.Importantly, the response time of the system, as defined as the time ittakes to obtain a reading that swings from 10% to 90% of the span of thesystem, from a change of from zero gas to full scale gas at a flow rateof 250 milliliters per minute, may be reduced to below 200 millisecondsusing the invention. This superior response time opens the possibilityfor real time monitoring of patient's respiration and the like. Thecompact package, within which the present invention may be embodied,opens up applications never before possible for infrared gas analysistechnology. Portable hand-held engine analyzers may now be embellishedwith exhaust gas analysis capabilities. Such possibilities are, indeed,revolutionary.

The graph in FIG. 12 illustrates the relationship between the outputvoltage of detector, or sensor, 50 and the input voltage applied tosource 36. An examination of FIG. 12 reveals that the graph of thedetector output voltage for each value of source voltage is in the sameproportion as the detector output for other source voltages. This is alinear relationship as depicted by sloping straight lines in FIG. 12.Because of the linear relationship between detector output voltage andsource voltage, a simulation of an occlusion in the sample cell can beachieved by reducing the source voltage to a known level. Because of thelinear relationship, the known reduced source voltage level shouldproduce a known reduced output voltage level. The actual voltage on thedetector output may be compared with the ideal reading in order todetermine a calibration factor to be applied to actual detector outputreadings with a sample gas in the sample chamber.

By adjusting the source voltage to multiple different reduced knownvoltage levels within a range of concentrations of the component gas tobe detected, a linearization of the instrument may be performed in anexceptionally fast, automated manner. The calibration factors obtainedfrom such linearization may be either kept in a look-up table for useduring gas sample measurements or may be used to generate thecoefficients of a fourth order polynomial, as will be appreciated by theskilled artisan. Indeed, the present invention allows an almost infinitemultiple point calibration/linearization of the gas analyzer.

Such improved calibration technique may be implemented by an infraredgas analyzer 115 (FIG. 13). Gas analyzer 115 utilizes an infrared sensorassembly 116 having an infrared source 136 and detector 50. Infraredsource 136 utilizes an emitter in an evacuated quartz envelope in thesame manner as infrared emitting element 42. Source 136 is suppliedelectrical energy from a power supply 130. Power supply 130 is made up atransistor 132 whose collector is connected with a DC voltage source,such as 12 volts DC, and whose emitter is connected with a terminal ofsource 136. The base/emitter junction of transistor 132 is driven fromthe output of a unity gain amplifier 134. Unity gain amplifier 134follows the output voltage level of a D/A converter 135. The analogoutput of D/A converter 135 is established by output levels of amicrocomputer 138. The output of detector 50 is amplified by anamplifier 140 and supplied to the input of an A/D converter 142 whosedigital output is supplied as an input to microcomputer 138.

In order to calibrate infrared gas analyzer 115, microprocessor 138supplies a digital signal to D/A converter 135 that constitutes areduced voltage level supplied to amplifier 134. Because transistor 132is connected in an emitter-follower configuration, the voltage suppliedto the emitting element of source 136 follows the output of D/Aconverter 135. The resulting output of detector assembly 128 isamplified by amplifier 140 and converted to digital form by A/Dconverter 142 and supplied as an input signal to microcomputer 138.Accordingly, a suitable program in microcomputer 138 allows theselection of one or more calibration levels for source 136 and theresulting output measured with a non-absorbing gas in the sensorassembly 116. The resulting calibration factor may then be stored withina look-up table in microcomputer 138.

When microcomputer 138 enters the calibration function 144, instructionsare provided at 146 to a gas-handling subsystem (not shown) to fill thechamber assembly 122 of sensor assembly 116 with a gas that isnon-absorbing at the absorption line of the gas to be detected by gasanalyzer 115 (FIG. 14). With the non-absorbing gas in the samplechamber, microcomputer 138 applies at 148 a reduced voltage level tosource 136. Detector 50 is read at 150 and microcomputer 138 determinesa calibration factor 152, which is stored in memory at 154. It is thendetermined at 156 whether an additional calibration point is to beobtained. If so, the control returns to 148 where microcomputer 138selects a new reduced voltage level to be applied to source 136. Whenall of the calibration points have been processed, as determined at 156,the calibration function is exited at 158.

Once a calibration table has been established in microcomputer 138,infrared gas analyzer 115 can then be utilized to measure theconcentration of a component gas in a sample. If a gas handlingsubsystem (not shown) is utilized, microcomputer 138 causes thegas-handling system to fill sample chamber 122 with a sample gas.Alternatively, the sample gas may be supplied by diffusion to the samplechamber. With the sample gas in the sample chamber, microcomputer 138supplies an output code to a D/A converter 135 to supply a full voltagelevel to source 136. The resulting level of radiation detected bydetector 50 and supplied by A/D converter 142 to microcomputer 138 isapplied to the look-up table in order to determine a concentration ofthe component gas in the gas sample. Microcomputer 138 may then producea display, or the like, to indicate such concentration value.

Microcomputer 138 may operate source 136 with an unmodulated continuousvoltage applied to the source in the same manner as gas analyzer 15.Alternatively, microcomputer 138 could apply a modulated voltage tosource 136, for example, in the form of a square wave, in which source126 is pulsed between alternating energized and non-energized periods.This latter form of modulated operation of source assembly 126 iscapable of a somewhat more accurate gas concentration reading because areference signal is developed. However, the response time of gasanalyzer 115 would be commensurately slower than if the source 136 isnot modulated.

An example of an infrared gas analyzer 215 that is capable of detectingconcentrations of multiple component gases in a sample is illustrated inFIG. 15. Gas analyzer 215 is useful, for example, in measuring multipleexhaust gases emitted from a vehicle engine. Gas analyzer 215 includes asensor assembly 216 having a source assembly with three or more sources236a, 236b, and 236c. Optical filters 256a, 256b, and 256c are eachrespectively positioned between one of the sources and a single detector150. Each source 236a-236c is connected with the emitter of a transistor232a-232c, respectively, which is driven in a collector-followerconfiguration by unity gain amplifiers 234a-234c. Amplifier 234a isdriven by the output of a D/A converter 235a, which converts an outputfrom a microcomputer 238 to a pulsed DC signal, as indicated in FIG. 15at (a). Amplifier 234b is operated from the output of a D/A converter235b, which is operated by microcomputer 238 to produce the waveformindicated at (b) in FIG. 15. Amplifier 234c is connected with the outputof a D/A converter 235c, which is driven by microcomputer 238 to producethe waveform indicated at (c) in FIG. 15. Thus, it is seen that sources236a, 236b, and 236c are each modulated and operated in a time-divisionmultiplexed sequence. The radiation emitted by each of the sources isdirected through its respective optical filters 256a-256c, each of whichcorresponds with an absorption line of one of the component gases to bedetected from a sample. The output of detector 50 is amplified byamplifier 240, converted to a digital format by A/D converter 242, anddemultiplexed in microcomputer 238, in order to determine theconcentrations of the component gases. Although gas analyzer 215 isillustrated with a single detector 50, separate detectors could beprovided within sensor assembly 216 for each of the sources. However,analyzer 215 advantageously makes use of a single detector for detectinga plurality of component gas concentrations. In the illustratedembodiment, sources 236a, 236b, and 236c are modulated at a 0.33 hertzpulse repetition rate.

The infrared gas analyzer and method disclosed herein provides acalibration technique which is both accurate and capable of beingimplemented in an electronic control scheme. In FIG. 12, graph Aillustrates a source/detector relationship at 50° C. Graph B illustratesthe same relationship at 1° C. A comparison of these graphs A and Billustrate that the linearity is exceptionally immune to variations inambient temperature. This may be explained, in pan, by the vacuumsurrounding the emitting element of the source. The vacuum resists thetransmission of ambient temperatures to change the color temperature ofthe source. Because the source is relatively immune to variations inambient temperature, and the detector is ambient temperaturecompensated, a calibration established at one ambient temperature willbe valid at significantly different ambient temperatures. Importantly,the calibration technique disclosed herein is so readily performed uponthe deployment of the instrument, that the instrument may be calibratedto the specific ambient temperature in which it is deemed operated. Thisresults in yet further accuracy in the readings taken by the instrument.

Changes and modifications in the specifically described embodiments canbe carried out without departing from the principles of the invention,which is intended to be limited only by the scope of the appendedclaims, as interpreted according to the principles of patent lawincluding the Doctrine of Equivalents.

The embodiments of the invention in which an exclusive property orprivilege is claimed are defined as follows:
 1. A method of spancalibrating a gas analyzer by determining at least one calibrationfactor, in which said analyzer detects at least one component gas in asample by applying electrical energy at a given level to a radiationsource in order to produce a given level of radiation having at leastone absorption line of said at least one component gas, directing thegiven level of radiation along an optical path through a sample chamber,detecting radiation attenuated by absorption by said at least onecomponent gas in said sample chamber at said at least one absorptionline, and resolving said detected radiation attenuated by absorption andat least one calibration factor into component gas concentration,including:filling said sample chamber with a gas that is non-absorbingof radiation at said at least one absorption line: applying electricalenergy at at least one known level that is different from said givenlevel of energy to said source in order to produce at least one knownlevel of radiation that is different from said given level of radiation;detecting with said detector said at least one known level of radiationin order to produce at least one output signal; and determining at leastone calibration factor as a function of said at least one output signalproduced from said at least one known level of radiation that isdifferent from said given level of radiation.
 2. The method of claim 1including applying electrical energy at multiple known levels that aredifferent from said given level of energy in order to produce multipleknown levels of radiation that are different from said given level ofradiation and determining multiple ones of said calibration factors as afunction of multiple output signals produced from said multiple levelsof radiation in order to linearize said gas analyzer.
 3. The method ofclaim 1 wherein said applying electrical energy to said source includesapplying un-modulated electrical energy to stud source.
 4. The method ofclaim 1 wherein said applying electrical energy to said source includesapplying modulated electrical energy to said source.
 5. The method inclaim 4 including providing a plurality of sources to detect a pluralityof component gases in a sample and including applying modulatedelectrical energy to said plurality of sources in a time-divisionsequence.
 6. The method of claim 1 including providing a radiationsource having an infrared emitter in an evacuated gas-imperviousenvelope.
 7. The method of claim 6 wherein said source is joined withsaid sample chamber in a manner that the sample is in direct contactwith the gas-impervious envelope.
 8. A gas analyzer for detecting atleast one component gas in a sample including:a sample chamber forcontaining a gas; a source for producing radiation having at least oneabsorption line of said at least one component gas, said radiationdirected through said sample chamber, and a detector for detectingradiation passing through said sample chamber, said detector producingan output signal that is a particular function of energy applied to saidsource; a power supply circuit including a digital-to-analog converterfor supplying electrical energy to said source in order to produce alevel of radiation that is a function of an analog output of saiddigital-to-analog converter; a microprocessor-based control forsupplying a digital signal to said digital-to-analog converter forcausing said power supply circuit to apply energy to said source at aselectable level in order to produce a selectable level of radiation,said control programmed to supply a digital signal to saiddigital-to-analog converter that will cause said power supply toenergize said source in a manner that will produce a first selectedlevel of radiation with a gas in said sample chamber that isnon-absorbing of radiation at said at least one absorption line, and todetermine a calibration factor as a function of said output signalobtained thereby; and said control programmed to supply a digital signalto said digital-to-analog converter that will cause said power supplycircuit to energize said source in a manner that will produce a secondlevel of radiation that is different from said first level, with asample gas in said sample chamber, and to obtain a sensing value of saidoutput signal; and said control programmed to determine a component gasconcentration as a function of said sensing value of said output signaland said calibration factor.
 9. The analyzer in claim 8 wherein sourceincludes an infrared emitter in an evacuated gas-impervious envelope andwherein said source is joined with said sample chamber in a manner thatthe sample is in direct contact with the gas-impervious envelope. 10.The analyzer in claim 8 wherein said source includes an infrared emitterin an evacuated gas-impervious envelope and wherein said source isjoined with said sample chamber in a manner that does not substantiallyreflect said infrared radiation toward said source.
 11. The analyzer inclaim 8 wherein said control includes an ambient temperature sensor andcompensates detected infrared radiation in response to the ambienttemperature level sensed by said temperature sensor.
 12. The analyzer inclaim 8 wherein said control is programmed to determine multiple ones ofsaid calibration factors at multiple different values of said firstselectable level of radiation in order to linearize said analyzer. 13.The analyzer in claim 8 wherein said power supply applies electricalenergy substantially continuously to said source.
 14. The analyzer inclaim 8 wherein said sample chamber is a tubular member open at oppositeends and said detector is fitted within the other of said opposite ends.15. The analyzer in claim 14 wherein said source includes an infraredemitted in a gas-impervious envelope and a reflector around a portion ofsaid envelope, said reflector being one of an elliptical reflector and aparabolic reflector.
 16. The analyzer in claim 8 wherein said controldetermines said component gas concentration at a response time of lessthan approximately 250 milliseconds.
 17. The analyzer in claim 16wherein said radiation is un-modulated.
 18. The analyzer in claim 8wherein substantially all of the radiation produced by said source isdirected through said sample.
 19. The analyzer in claim 18 wherein saidradiation is un-modulated.
 20. The analyzer in claim 8 wherein saidcontrol resolves said detected infrared radiation to component gasconcentration independently of source emissivity.
 21. The analyzer inclaim 20 wherein said radiation is un-modulated.
 22. The analyzer inclaim 8 wherein said power supply applies electrical energy to saidsource intermittently.
 23. The analyzer in claim 22 including aplurality of said sources in order to detect a plurality of componentgases in a sample and wherein said power supply applied modulatedelectrical energy to said plurality of sources in a time-divisionsequence.